Fringe patterns can be formed coherently using various interferometers and incoherently using the moirâe technique. They can also be designed in fringe projection profilometry. All of these techniques are useful for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. This book addresses the challenges and solutions involved in this process. Both theoretical analysis and algorithm development will be covered to facilitate the work of both researchers and engineers. The information herein may also serve as a specialized subject for students of optical and/or computer engineering.