Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction
7%
OFF
Available
 
About the Book
Aberration-Corrected Imaging in Transmission Electron Microscopy
Book Details
ISBN-13: 9781848165366
EAN: 9781848165366
Publisher Date: 01 Jul 2010
Binding: Hardcover
Continuations: English
Dewey: 502.825
Illustration: Y
LCCN: 2010537481
No of Pages: 335
Series Title: English
Sub Title: An Introduction
ISBN-10: 1848165366
Publisher: Imperial College Press
Acedemic Level: English
Book Type: English
Depth: 25
Height: 245 mm
Language: English
MediaMail: Y
PrintOnDemand: N
Spine Width: 20 mm
Width: 165 mm