Applied Electromagnetics and Electromagnetic Compatibility
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About the Book
Applied Electromagnetics and Electromagnetic Compatibility deals with Radio Frequency Interference (RFI), which is the reception of undesired radio signals originating from digital electronics and electronic equipment. With today's rapid development of radio communication, these undesired signals as well as signals due to natural phenomena such as lightning, sparking, and others are becoming increasingly important in the general area of Electro Magnetic Compatibility (EMC). EMC can be defined as the capability of some electronic equipment or system to be operated at desired levels of performance in a given electromagnetic environment without generating EM emissions unacceptable to other systems operating in the vicinity.

About the Author

DIPAK L. SENGUPTA, PhD, is Professor Emeritus and Research Scientist at the Radiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor. He is a Life Fellow of IEEE, and his professional interests are in the areas of antennas, electromagnetics, electromagnetic compatibility, and navigation systems.

VALDIS V. LIEPA, PhD, is a Research Scientist at the Radiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, where he works on problems relating to applied electromagnetics and EMC compliance. Dr. Liepa is a Life Member of IEEE.

Book Details
ISBN-13: 9780471165491
EAN: 9780471165491
Publisher Date: 01/09/2005
Bood Data Readership Text: Professional & Vocational
Dewey: 537
Height: 239 mm
Illustrations: Illustrations
LCCN: 2005047029
No of Pages: 486
Pagination: 486 pages, Illustrations
Returnable: N
Spine Width: 28 mm
Width: 162 mm
ISBN-10: 0471165492
Publisher: John Wiley and Sons Ltd
Binding: Hardcover
Country Of Origin: United Kingdom
Gardner Classification Code: K00
Illustration: Y
Language: English
MediaMail: Y
Number of Items: 01
PrintOnDemand: Y
Series Title: Wiley Series in Microwave and Optical Engineering
Star Rating: 1
Year Of Publication: 2005