Atomic Force Microscopy/Scanning Tunneling Microscopy 2
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About the Book
Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
Book Details
ISBN-13: 9780306455964
EAN: 9780306455964
Publisher Date: 30 Apr 1997
Bood Data Readership Text: Undergraduate
Edition: 1997
Height: 254 mm
Illustrations: biography
LCCN: 97009548
No of Pages: 250
Pagination: 250 pages, biography
Returnable: N
Spine Width: 16 mm
UK Availability: GXC
Year Of Publication: 1997
ISBN-10: 030645596X
Publisher: Springer Science+Business Media
Binding: Hardcover
Dewey: 502.82
Gardner Classification Code: K00
Illustration: Y
Language: English
MediaMail: Y
Number of Items: 01
PrintOnDemand: N
Series Title: English
Star Rating: 0
Width: 178 mm