Electron Nano-Imaging: Basics of Imaging and Diffraction for Tem and Stem
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About the Book
Electron Nano-Imaging: Basics of Imaging and Diffraction for Tem and Stem
Book Details
ISBN-13: 9784431565000
EAN: 9784431565000
Binding: Hardcover
Language: English
Series Title: English
ISBN-10: 4431565000
Publisher: Springer
Dewey: 620.11
No of Pages: 333
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