Embedded Systems: Design, Analysis and Verification: 4th Ifip Tc 10 International Embedded Systems Symposium, Iess 2013, Paderborn, Germany, June 17-1
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Book Details
ISBN-13: 9783642388521
EAN: 9783642388521
Publisher Date: 28/06/2013
Dewey: 004.24
Language: English
No of Pages: 354
Series Title: English
Width: 154 mm
ISBN-10: 3642388523
Publisher: Springer
Binding: Hardcover
Height: 230 mm
MediaMail: Y
PrintOnDemand: N
Spine Width: 22 mm