Electron Energy-Loss Spectroscopy in the Electron Microscope
9%
OFF
Available
 
About the Book
The Second Edition explores several new applications of EELS developed during the last ten years. The chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections.
Book Details
ISBN-13: 9780306452239
EAN: 9780306452239
Publisher Date: 31 May 1996
Dewey: 543.085
Height: 237 mm
Language: English
MediaMail: Y
Number of Items: 01
Series Title: English
Width: 159 mm
ISBN-10: 0306452235
Publisher: Springer
Binding: Hardcover
Edition: 0002-
Illustration: Y
LCCN: 96011645
No of Pages: 500
PrintOnDemand: N
Spine Width: 32 mm