High Energy Electron Diffraction and Microscopy
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About the Book
This book provides the reader with a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.
Book Details
ISBN-13: 9780198500742
EAN: 9780198500742
Publisher Date: 08 Jan 2004
Bood Data Readership Text: Professional & Vocational
Gardner Classification Code: K00
Illustration: Y
Language: English
MediaMail: Y
Number of Items: 01
PrintOnDemand: N
Series Title: Monographs on the Physics & Chemistry of Materials
Star Rating: 0
Width: 161 mm
ISBN-10: 0198500742
Publisher: OUP Oxford
Binding: Hardcover
Country Of Origin: United Kingdom
Height: 241 mm
Illustrations: numerous halftones & figures
LCCN: 2004556119
No of Pages: 558
Pagination: 558 pages, numerous halftones & figures
Returnable: N
Spine Width: 33 mm
UK Availability: GXC