High-resolution Imaging and Spectrometry of Materials
Available
 
About the Book
This book gives a survey of, and systematic introduction to, high-resolution electron microscopy. The method is thoroughly discussed; the latest developments are reported; and applications to surface and interface analysis and to the study of hidden structures are detailed. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
Book Details
ISBN-13: 9783540418184
EAN: 9783540418184
Publisher Date: 11/12/2002
Bood Data Readership Text: Postgraduate, Research & Scholarly
Dewey: 620.112
Height: 245 mm
Illustrations: biography
LCCN: 2002030612
No of Pages: 442
PrintOnDemand: N
Spine Width: 41 mm
Width: 168 mm
ISBN-10: 3540418180
Publisher: Springer
Binding: Hardcover
Country Of Origin: Germany
Gardner Classification Code: K00
Illustration: Y
Language: English
MediaMail: Y
Pagination: 442 pages, biography
Series Title: Springer Series in Materials Science
Star Rating: 1
Year Of Publication: 2002