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Metrology, Inspection, and Process Control for Microlithography XXIII
(Paperback)
By:
John A. Allgair
(Author)
,
Christopher J. Raymond
(Author)
| Publisher:
Spie Press
R
21,167
Available
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About the Book
Metrology, Inspection, and Process Control for Microlithography XXIII
Book Details
ISBN-13:
9780819475251
EAN:
9780819475251
Binding:
Paperback
Country Of Origin:
United States
Illustrations:
Illustrations
Pagination:
2 pages, Illustrations
Series Title:
Proceedings of SPIE
UK Availability:
GXC
ISBN-10:
0819475254
Publisher:
Spie Press
Bood Data Readership Text:
Professional & Vocational
Gardner Classification Code:
K00
No of Pages:
2
Returnable:
Y
Star Rating:
0
Year Of Publication:
2009
Related Categories
Biographies & Memoirs
>
Biography: general
>
Biography: arts & entertainment
Technology & Engineering
>
Other technologies & applied sciences
>
Applied optics
>
Fibre optics
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