Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
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About the Book
Reliability of High Mobility Sige Channel Mosfets for Future Cmos Applications
Book Details
ISBN-13: 9789400776623
EAN: 9789400776623
Publisher Date: 29/10/2013
Binding: Hardcover
Continuations: English
Height: 234 mm
MediaMail: Y
PrintOnDemand: Y
Spine Width: 13 mm
ISBN-10: 9400776624
Publisher: Springer Verlag
Acedemic Level: Academic_Level
Book Type: Academic_Level
Dewey: 537.622
Language: English
No of Pages: 187
Series Title: Springer Series in Advanced Microelectronics
Width: 155 mm
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