Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy
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About the Book
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy
Book Details
ISBN-13: 9783662505571
EAN: 9783662505571
Binding: Paperback
Height: 230 mm
No of Pages: 382
Spine Width: 21 mm
ISBN-10: 3662505576
Publisher: Springer
Dewey: 530.41
Language: English
Series Title: English
Width: 154 mm
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