Testing and Testable Design of High-Density Random-Access Memories
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Book Details
ISBN-13: 9781461286325
EAN: 9781461286325
Publisher Date: 27 Sep 2011
Dewey: 621.397
Language: English
No of Pages: 386
Returnable: N
Spine Width: 22 mm
ISBN-10: 1461286328
Publisher: Springer
Binding: Paperback
Height: 230 mm
MediaMail: Y
PrintOnDemand: N
Series Title: English
Width: 154 mm
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