VLSI-Soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-Soc 2

VLSI-Soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-Soc 2 (Hardcover)

By: Youngsoo Shin (General editor) , Chi Ying Tsui (General editor) , Jae-Joon Kim (General editor) | Publisher: Springer | Released: 13/09/2016

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VLSI-Soc: Design for Reliability, Security, and Low Power: 23rd Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-Soc 2

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