Reliability of High Mobility Sige Channel Mosfets for Future CMOS Applications
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About the Book
Reliability of High Mobility Sige Channel Mosfets for Future CMOS Applications
Book Details
ISBN-13: 9789402402056
EAN: 9789402402056
Publisher Date: 23/08/2016
Dewey: 537.622
Language: English
No of Pages: 187
Series Title: English
Width: 154 mm
ISBN-10: 9402402055
Publisher: Springer
Binding: Paperback
Height: 230 mm
MediaMail: Y
PrintOnDemand: Y
Spine Width: 11 mm
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