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Metrology, Inspection, and Process Control for Microlithography XXV
(Paperback)
By:
Christopher J. Raymond
(Author)
| Publisher:
Spie Press
R
15,152
Available
Google Preview
About the Book
Metrology, Inspection, and Process Control for Microlithography XXV
Book Details
ISBN-13:
9780819485304
EAN:
9780819485304
Binding:
Paperback
Country Of Origin:
United States
Height:
229 mm
No of Pages:
854
Returnable:
Y
UK Availability:
GXC
Year Of Publication:
2011
ISBN-10:
0819485306
Publisher:
Spie Press
Bood Data Readership Text:
General (US: Trade)
Gardner Classification Code:
U01
Illustrations:
illustrations
Pagination:
854 pages, illustrations
Star Rating:
0
Width:
152 mm
Related Categories
Dictionaries & Language
>
Language: reference & general
>
Language: history & general works
References & Encyclopaedias
>
Research & information: general
>
Data analysis: general
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