Metrology, Inspection, and Process Control for Microlithography XXII by John A. Allgair,Christopher J. Raymond,John A. Allgair,Christopher J. Raymond | uRead.com-Books | online bookstore | 9780819471079

Metrology, Inspection, and Process Control for Microlithography XXII (Paperback)

By: John A. Allgair (Author) , Christopher J. Raymond (Author) , John A. Allgair (Author) , Christopher J. Raymond (Author) | Publisher: Spie Press

Metrology, Inspection, and Process Control for Microlithography XXII

R14,473

R11,434

21%
OFF

Available

Book Details

ISBN-13:	9780819471079
Publisher:	Spie Press
Bood Data Readership Text:	Professional & Vocational
Illustrations:	Illustrations
Pagination:	1344 pages, Illustrations
Series Title:	Proceedings of SPIE
UK Availability:	GXC

ISBN-10:	0819471070
Binding:	Paperback
Gardner Classification Code:	K00
No of Pages:	1344
Returnable:	Y
Type:	Professional & Vocational
Year Of Publication:	2008

Related Categories

Technology & Engineering > Other technologies & applied sciences > Applied optics
Technology & Engineering > Other technologies & applied sciences > Applied optics > Fibre optics

BestsellersView More

Star Wars: Darth Vader - Dark Lord of the Sith Vol. 1

R1,270R862 Star Wars: Darth Vader - Dark Lord of the Sith Vol. 1

The Subtle Art of Not Giving A F*Ck: A Counterintuitive Approach to Living a Good Life

R1,270R800 The Subtle Art of Not Giving A F*Ck: A Counterintuitive Approach to Living a Good LifeMark Manson

Scion Of Ikshvaku

R350R276 Scion Of IkshvakuAmish

Sapiens

R499R394 SapiensYuval Noah Harari

Thinking, Fast and Slow

R499R394 Thinking, Fast and SlowDaniel Kahneman